Traceability of scrap of wafer production orders

We have wafers that start the production order with a UOM inches. Out of potentially 10 circuits that could have been created only 8 with the other 2 scrap.

We are looking for the best approach for traceability to know which wafers had the most scrap. Currently we don't have batch management. We want to trace the yield of each wafer.

We could have done 10 production order but that would result in 100K production orders. Your thoughts appreciated